Guangzhou UC Instruments., Co. Ltd.
Guangzhou UC Instruments., Co. Ltd.
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Four-Channel 24.5~29Gb/S Tunable Error Meter High Performance Test Equipment
The four-channel 24.5~29Gb/s tunable bit error meter is a kind of high performance test equipment, which is mainly used for the bit error rate test of high-speed digital communication systems and optical communication devices.
Product overview
The four-channel 24.5~29Gb/s tunable error meter integrates functions such as internal reference clock, graphic signal generator, clock recovery circuit and error analysis in one, which can provide high-precision error rate testing. The device supports four independent photoelectric channels, each with a rate of up to 29Gb/s, and is suitable for measurement of multiple rate devices.
The U9225C four-channel 24.5 ~ 29Gps tunable bit error meter is mainly used for the bit error test of 100G TOSA/ROSA devices, and can be easily used for the measurement of different speed devices. The U9225C has the characteristics of high precision, high cost performance, simple and convenient operation, etc., and has been widely used in optical communication manufacturing production lines, universities and scientific research institutions.
The U9225C integrates internal reference clock, graphic signal generator, clock recovery circuit and error analysis in one, while providing photoelectric interface and USB data communication interface, each channel rate up to 29Gbps.
Product characteristics
High precision: The equipment adopts advanced testing technology and algorithm, which can accurately measure the bit error rate of the tested system to ensure the reliability of the test results.
High cost performance: Compared with similar products, the equipment has a high cost performance and can meet the needs of different users.
Easy to operate: The equipment is designed with a friendly user interface and easy to operate control system, and users can easily complete the test operation.
Versatility: In addition to the basic bit error rate test function, the device also supports multiple test modes and custom test sequences to meet different test needs.
Specification
| Absolute Maximum Ratings | Symbol | Min. | Typ. | Max. | Unit | Notes |
| Storage Temperature | Ts | -20 | – | 70 | °C | |
| AC Voltage Range | VAC | 90 | – | 246 | VAC | |
| AC Voltage Frequency Range | VFREQ | 47 | – | 63 | Hz | |
| Data RF Voltage Input | VinData | -0.3 | – | 1.2 | V | |
| Clock In Voltage Input | VinClk | 0 | – | 1.2 | V | |
| USB Pin Voltage | VinUSB | -0.3 | – | 5.5 | V | |
| RF and Clock ESD HBM | RFesdH | -1000 | – | 1000 | V | |
| RF, Clock and USB Latchup | Vl | -100 | – | 100 | mA | |
| USB ESD HBM | USBesdH | -2000 | – | 2000 | V | |
| USB ESD CDM | USBesdC | -500 | – | 500 | V | |
| Electrical Characteristics | Symbol | Min. | Typ. | Max. | Unit | Notes |
| Case Temperature | Tc | 5 | – | 45 | °C | |
| AC Supply Current | Icc | 0.75 | 200 | – | mA | |
| Baud Rate (NRZ format) | BR | 12.25/24.5 | 14.5/29 | Gb/s | ||
| Baud Rate Setpoint Accuracy | BRa | -10 | – | 10 | PPM | (Note 1) |
| Baud Rate PPM Offset | BRo | -999 | – | 999 | PPM | 1 PPM step size |
| Power On Initialization Time | Ton | – | – | 15 | Seconds | |
| Eye Phase Steps | EMp | – | – | 128 | Steps | .16 pS per unit |
| Eye Amplitude Steps | EMv | – | – | 64 | Steps | 8 mV per unit |
| Note 1: Aging, Temperature and Voltage | ||||||
Scope of application
Four-channel 24.5~29Gb/s tunable error meter is widely used in the following fields:
Optical communication manufacturing: In the development and production of optical communication devices (such as TOSA, ROSA, etc.), the equipment can be used to test the bit error rate performance of the device.
Universities and scientific research institutions: In scientific research projects in the fields of optics and electronic engineering, the equipment can be used to verify theoretical models and test new technologies.
Digital communication system: During the installation, debugging and maintenance of the digital communication system, the equipment can be used to test the bit error rate performance of the system to ensure the stable operation of the system.
